Machine Learning

Evaluation of Human-Bias in Machine Learning Models for Electron Microscopy

Evaluating how human perception in ambiguous images impacts extrinsic errors in common machine learning frameworks for feature detection

Real-time Microscopy Quantification Using Machine Learning

Applications of edge computing and machine learning to automatically identify features in micrographs

Defect Detection Using Deep Learning

Using machine vision techniques for rapid defect detection in electron microscopy images.