Multi defect detection and analysis of electron microscopy images with deep learning

Mingren Shen, Guanzhao Li, Dongxia Wu, Yuhan Liu, Jacob RC Greaves, Wei Hao, Nathaniel J Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, {Others}
January 2021
Type
Journal article
Publication
In: Computational Materials Science, (199), pp. 110576

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